Logic when Collecting a Charge from Tracks of Single Ionizing Particles
https://doi.org/10.1134/S2304487X21030123
Abstract
We have studied a 65-nm bulk CMOS triple majority gate based on the NAND logic with a topological structure in which all the transistors of the output 3NAND gate are one-by-one inserted into groups of transistors of the same type of three input NAND gates mutually separated by shallow trench insulation. The study involves the classification and analysis of error pulses that occur at the output of the majority gate when collecting charge from tracks of single ionizing particles both before and after switching the element at the inputs. The study carried out by means of 3D TCAD using tracks with a normal direction to the chip surface and a linear energy transfer of 60 MeV cm2/mg by a particle to a track. Four types of error pulses formed at the output of the majority element are established, which are based on the transition of the element to a nonstationary state when collecting charge from tracks of single particles. These are two types of error pulses formed before switching the element at the inputs of their 0 state to the 1 state. These is an error pulse with the nonstationary state duration, when the duration from the time of the track formation is farther to the time of switching the signals at the inputs from the 0 state to the 1 state compared to the duration of the nonstationary state, and an error pulse of ahead switching of the element before switching the inputs. In addition, there are two more types of error pulses generated at the output of the majority element after switching the inputs from the 1 state to the 0 state, namely, an error pulse with an additional delay in switching the element and an error pulse with the duration of the nonstationary state after switching the element.
Keywords
error pulse,
logical element,
triple majority gate,
simulation,
single particle,
charge collection,
track
Supporting agencies: The study was carried out with the financial support of the Russian Foundation for Basic Research within the framework of scientific project No. 19-07- 00651
About the Authors
V. Ya. Stenin
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Russian Federation
Russian Federation
115409
Moscow
Yu. V. Katunin
Scientific Research Institute of System Analysis, Russian Academy of Sciences
Russian Federation
Russian Federation
117218
Moscow
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Review
For citations:
Stenin V.Ya., Katunin Yu.V. Logic when Collecting a Charge from Tracks of Single Ionizing Particles. Vestnik natsional'nogo issledovatel'skogo yadernogo universiteta "MIFI". 2021;10(3):244-252. (In Russ.) https://doi.org/10.1134/S2304487X21030123
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