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On the Possibility of Testing Dielectric Materials for Heat Shock

https://doi.org/10.1134/S2304487X20060036

Abstract

   A device for cumulating plasma clots when testing the surface of dielectric materials for heat shock has been used. The thermal effect on the material can be carried out in a short time interval (no more than 0.1 s) at a sufficiently high temperature (up to 4500 K). The experiments have been performed at atmospheric pressure by an electric explosion of a conducting diaphragm with a current pulse up to 16 kA, a duration of 70 to 100 ms, and an input energy up to 50 kJ. The test device and its appearance are presented. Photos of the effect of the heat shock on the surface of dielectric and ceramic materials on a short-term thermal effect – heat shock during an electric explosion of a conducting diaphragm – are presented. The results obtained on testing of dielectric materials for the short-term heat shock indicate that surface short-term thermal impact (shock) on heat-loaded dielectric materials is promising.

About the Author

L. V. Furov
Vladimir State University
Russian Federation

600000

Vladimir



References

1. GOST IEC 60811-509-2015. Electrical and fiber-optic cables. Test methods for non-metallic materials. Part 509. Mechanical test. Testing of insulation and shells for resistance to cracking (heat shock test) [State Standard 60811-509-2015.] Moscow, Standartinform Publ., 2016. 11 р.

2. Kunin N. V., Konopasov N. G., Pleshivtsev V. S. Indukcionnyi nakopitel elektrisheskoi energii [Induction storage of electrical energy], Prib. Tekh. Ehsp., 1988, no. 3, pp. 103–104. (in Russian)

3. Furov L. V. et al., Ustroistvo kumulyacii plasmennyh sgustkov [The device of the accumulation of plasma clots], Patent RF, no. 2692689, 2019.

4. Ed. by Grigor’eva I. S., Meilikhova E. Z. Physical magnitudes: Guide [Physical magnitudes: Guide], Moskow, Energoatomizdat, 1991. P. 307.


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For citations:


Furov L.V. On the Possibility of Testing Dielectric Materials for Heat Shock. Vestnik natsional'nogo issledovatel'skogo yadernogo universiteta "MIFI". 2020;9(6):489-492. (In Russ.) https://doi.org/10.1134/S2304487X20060036

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