Evaluation of the Quality of New X-Ray Protective Coatings

Abstract

The use of polymer materials and composites based on them to protect against various types of radiation has become quite widespread in recent years. In this regard, the creation of new X-ray protective materials based on polymers is relevant. This work is devoted to the development of a comprehensive technique using atomic force microscopy for non-destructive quality control of X-ray self-adhesive polymer coatings. To ensure high levels of protection, filler particles should be uniformly distributed in the polymer matrix. The process of dispersion of particles in a polymer matrix is determined by the ratio of the intensities of interaction of particles with each other and with the matrix. Therefore, in order to optimize the technology and composition of the composite, it is necessary to control the uniformity of the filler distribution in the matrix, as well as to evaluate the strength of interfacial interactions. Samples based on different types of rubbers with fillers (barite, lead) have been examined on a scanning probe microscope SolverNext (NT-MDT, Zelenograd) in several modes of atomic force microscopy without changing the cantilever: topography, phase contrast, and force spectroscopy. Atomic force microscopy images have been processed using the standard ImageAnalisisP9 software. It is shown that a set of complementary modes of atomic force microscopy makes it possible to identify subtle differences in the microstructure of the composite, which is important for assessing the quality of materials using nanopowders.