Stenin V.Ya., Katunin Yu.V. Features of a Noise Pulse Formation when Switching a CMOS Element and Exposure to an Ionizing Particle. Vestnik natsional'nogo issledovatel'skogo yadernogo universiteta "MIFI". 2020;9(4):345-356. (In Russ.) https://doi.org/10.56304/S2304487X20030098
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